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The State of Multi-Die Testing: Essential Insights for Designers

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Manage episode 485727820 series 2426529
Content provided by EE Times On Air. All podcast content including episodes, graphics, and podcast descriptions are uploaded and provided directly by EE Times On Air or their podcast platform partner. If you believe someone is using your copyrighted work without your permission, you can follow the process outlined here https://podcastplayer.com/legal.

The semiconductor industry is undergoing a shift with the rapid adoption of multi-die design, driven by the promise of improved power, performance, and area (PPA). But with innovation comes complexity, and one of the biggest challenges is ensuring silicon reliability and health through effective multi-die testing.

In this episode, we dive deep into the world of multi-die design for test: what it means, how it differs from traditional monolithic design testing, and why it’s critical for the future of semiconductor manufacturing. Learn how testing spans from individual dies to multiple dies to die-to-die links, and why silicon data is essential for maintaining multi-die health during both manufacturing and in-field operations. We will explore the future of multi-die design for test and discuss Silicon Lifecycle Management (SLM) strategies that designers can implement today to stay ahead.

  continue reading

267 episodes

Artwork
iconShare
 
Manage episode 485727820 series 2426529
Content provided by EE Times On Air. All podcast content including episodes, graphics, and podcast descriptions are uploaded and provided directly by EE Times On Air or their podcast platform partner. If you believe someone is using your copyrighted work without your permission, you can follow the process outlined here https://podcastplayer.com/legal.

The semiconductor industry is undergoing a shift with the rapid adoption of multi-die design, driven by the promise of improved power, performance, and area (PPA). But with innovation comes complexity, and one of the biggest challenges is ensuring silicon reliability and health through effective multi-die testing.

In this episode, we dive deep into the world of multi-die design for test: what it means, how it differs from traditional monolithic design testing, and why it’s critical for the future of semiconductor manufacturing. Learn how testing spans from individual dies to multiple dies to die-to-die links, and why silicon data is essential for maintaining multi-die health during both manufacturing and in-field operations. We will explore the future of multi-die design for test and discuss Silicon Lifecycle Management (SLM) strategies that designers can implement today to stay ahead.

  continue reading

267 episodes

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